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布鲁克Bruker 90纳米压痕仪
面议布鲁克 Sierra SPR®-32 Pro
面议布鲁克 Bruker PI 89 扫描电镜纳米压痕仪
面议布鲁克Bruker三维光学轮廓仪Contour Elite X
面议布鲁克 Bruker 三维光学轮廓仪 ContourSP
面议布鲁克Bruker 三维光学轮廓仪ContourGT-X
面议布鲁克 Bruker光学轮廓仪 ContourX-200
面议布鲁克Bruker 三维光学轮廓仪 ContourX-500
面议布鲁克Bruker 三维光学轮廓仪ContourX-100
面议布鲁克Bruker Dektak XTL探针式轮廓仪
面议布鲁克Bruker Dektak XT探针式轮廓仪
面议MicroChem 电子束光刻胶 PMMA
面议InSight AFP is the world’s highest performance and industry preferred CMP profiling and etch depth metrology system for advanced technology nodes. The combination of its modern tip scanner with inherently stable capacitive gauges and an accurate air-bearing positioning system enables non-destructive, direct measurements in the active area of dies.